Author(s)

Kenichi Sugihara, Kunio Takahashi & Tadao Onzawa

Abstract

To understand adhesional phenomena, it is significant to obtain force curves between surfaces, because the relationship between the force and the tip- sample distance contains the infomation on surfaces. Usually the stiffness of force measurement system of AFM (Atomic Force Microscopy) is under the order of 10 N/m. The stiffer force measurement system, however, results in more information on surfaces, because higher stiffness lead to the wider range of force curves, secondly because the force curve obtained through the stiffer one describes more precise relationship between relative tip-sample separation and interaction force. On the other hand higher stiffness de- grades the force resolution. In this paper three mechanisms are compar

Keywords