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Author(s): C.H.T. Pan & J.J. Rencis
Abstract:
d Paper
Theoretical foundation for high-resolution
modeling of thin fluid films with BEM
C.H.T.
Pan*, J.J.
Rencis^
"Columbia University, Digital Equipment
Corporation, Millbury, Massachusetts 01527, USA
Mechanical Engineering Department,
Worcester Polytechnic Institute, Worcester,
Massachusetts 01609, USA
ABSTRACT
In modeling thin fluid films with the high resolution algorithm (HRA), Pan et
al.
[1], Li and Pan [2], two computational scales are present on any line in the
interior of the domain of interest.
The coarse scale is governed by discretization
of the two-dimensional physical space and determines the economical aspects
of computation.
The fine scale deals with distributed fields imbedded within
the discretized computation system.
An accurate pressure profile is obtained by
performing integration along the interior mesh line with a "precisely" described
film thickness profile and the mean longitudinal flux in the role of a local
...
Pages: 26
Size: 1,821 kb
Paper DOI: 10.2495/BE930041
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